TestForum is an annual event that Nordic Test Forum (NTF) runs every fall/early winter. NTF also runs 2 to 3 thematic events during a year, but these are focused events addressing basically only one topic area, each in the area of test and inspection of electronics, whereas TestForum typically has 3-thematic areas and cover the broader balance of test and inspection as well.

This year the number of attendants where around 50 and came from the Nordic countries as well as from Germany, Great Britain, France, The Netherlands and USA.

Key note speaker Stig Öresjö (Agilent Technologies, USA) presented "Test strategies yesterday, today and tomorrow".

More invited speakers where Michael J. Smith (Teradyne Assembley Test Division, USA) presenting "The effects of Business and Technology on Image Inspection" and Göran Wetter (IVF, Industrial R&D Corp., Sweden) presented "Real-time microfocus X-ray - a tool for quality control and failure analysis of electronics". Gunnar Carlsson (Ericsson, Sweden) had to stay in bed, but had prepared the presentation "System Test and Boundary Scan".

The three sessions where
1. Boundary Scan - System test
2. Functional test and fixtures
3. AOI/AXI inspection

The panel session was "Does AOI/AXI remove the need for ICT and functional test?"
The answer was NO! All techniques are needed, however it is product dependent, what technique to use.

Conference manager Birger Schneider (MicroLex A/S)

From Left Mick Austin (JTAG Technologies, Finland), Knut Baatstoloekken (Kitron Arendal A/S, Norway) and Birger Schneider (MicroLex A/S, Denmark)

From left Ole Fleaker (Buskeby University College), Bengt Magnhagen (Jonkoping University), Stig Oresjo (Agilent Technology)

Knut Baatstoloekken (Kitron Arendal A/S), President Nordic Test Forum

From left Birger Schneider (MicroLex), Stig-Gunnar Jensen, (Flextronics Design A/S),
Ole H. Flesaker (Buskerud University College)

Stig Oresjo (Agilent Technologies, USA) invited speaker, originally from Motala, Sweden.

From left Biger Schneider (MicroLex A/S), Knut Baatstoloekken (Kitron A/S),
Mick Austin (JTAG)

From left Mikael Löfbom, Hans-Erik Uleander (Saab Test Systems AB, Sweden)

Pete Collins (JTAG, The Netherlands)

Secretary Suzanne Holte, (MicroLex)

Mick Austin (JTAG) and Olivier Wilms (National Semiconductor, France)

Olivier Wilms, (National Semiconductor)

From left Mick Austin (JTAG), Michael J. Smith (Teradyne, USA)

Happy members at dinner table

Cosy discussions at another table

Bo Öhrwall (Pickering Interfaces AB) left and Knut Bootstoloekken right (laughing?).

Night discussions, from lefr  Kari Uimarihuhta (Sanmina-SCI, Finland, Mehrdad Ghaffarpour (Simrad Egersund A/S), Karl-Erik Gustavson (Elnitec AB) and Knut Bootstoloekken (Kitron Arendal A/S)

Mehrdad Ghaffarpour (Simrad Egersund A/S) and Lars-Erik Gustavson (Elnitec AB)

Loudly chatting in the pub at late night

Stefan Becker (Phoenix X-ray, Germany)

On the ferry boat from Helsingoer to Helsingborg