Program
The program is also available as pdf. This page was updated 07.04.2008.
Register for the seminar.
| NTF06 -- 27 - 28 November 2007 | ||
| Day 1 - Tuesday 27 November 2007 | ||
| Time | Title | Presenter and other info |
| 09:00 |
Registration |
|
| 09:30 |
Welcome/Introduction |
Birger Schneider |
| 09:40 |
Key Note Session |
Chairman: Knut Båtstoløkken |
| 09:40 |
The Next Five Years in Test and Inspection
|
Michael J. Smith, Teradyne |
| 10:45 |
Coffee Break / Exhibition |
|
| 11:00 |
Tutorial and Exhibiters presentations |
Chairman: Bjørn B. Larsen |
| 11:00 |
Analog to Digital Conversion – Old and New
Methods and their Features
|
Thomas Lagö, Acticut International AB |
| 11:30 |
Exhibitor presentations
|
All Exhibitors |
| 11:30 |
Exhibitor presentations |
Chairman: Bjørn B. Larsen |
| 12:00 |
Exhibition |
|
| 12:30 |
Lunch |
|
| 13:30 |
Session 1: Test Strategies, Test Data Management |
Chairman: Artur Jutman |
| 13:30 |
Description of AXXE Logistics internal manufacturing test system
|
Rolf Østvik, AXXE Logistics |
| 14:00 |
Design for Manufacture: A Key Factor in Cost Reduction for Telecommunications Infrastructure |
Arno Kolk, Elcoteq |
| 14:30 |
Coffee Break/Exhibition |
|
| 15:00 |
Session 2: AOI/X-Ray Inspection |
Chairman: Tauno Jokinen |
| 15:00 |
Beating the chip counterfeiters |
Keith Bryant, Dage |
| 15:30 |
X-ray nanoCT: Visualizing of internal 3D-Structures with Submicrometer Resolution |
André Egbert/Dirk Neuber, Phoenix|X-ray |
| 16:00 |
AOI |
Chris Davies, VI Technologies |
| 16:30 |
AOI |
Agilent |
| 17:00 |
Fruit & Refreshments / Exhibition |
|
| 17:15 | News from conferences | Mick Austin; Artur Jutman, Mike Smith |
| 17:45 |
Panel debate: "The New Age of Wireless – RF Testing in Perspective" |
Panel moderator: Birger Schneider |
| 20:00 | Dinner | |
| 21:30 | Social get-together | |
| Day 2 - Wednesday 28 November 2007 | ||
| Time | Title | Presenter |
| 08:30 |
Session 3: RF-Testing |
Chairman: Birger Schneider |
| 08:30 |
RF Testing |
Leif Johansson, National Instruments |
| 09:00 |
Bluetooth, RFID & Zigbee Short Range Technologies, Test Requirements Seen From a T&M Supplier |
Tomas Rønberg, Rohde-Schwarz |
| 09:30 |
RF Testing |
Agilent |
| 10:00 |
Coffee Break / Exhibition |
|
| 10:30 |
Session 4: Functional Testing/Remote Test |
Chairman: Stig-Gunnar Jensen |
| 10:30 |
Introduction to the Remote Access Testing Platform Project |
Juha Häkkinen, Oulu University |
| 11:00 |
Protocol Requirements in an SJTAG/IJTAG Environment |
Erik Larsson, Linköping TU |
| 11:30 |
Synthetic Instruments User Case |
Birger Schneider, microLEX |
| 12:00 |
Lunch |
|
| 13:00 |
Session 5: Fixturing |
Chairman: Bengt Magnhagen
|
| 13:00 |
Enhancing Mass Interconnect performance in PXI based test systems |
Gary Clayton, MAC Panel |
| 13:30 |
Importance of a Good Test Interface |
Peter Van Oostrom; Virginia Panel Corporation |
| 14:00 |
Test Challenges in the Norwegian Market |
Espen Evjenth, Testpro |
| 14:30 |
Coffee Break / Exhibition |
|
| 15:00 |
Session 6: Boundary Scan |
Chairman: Mick Austin |
| 15:00 |
Combined Boundary Scan and analog testing |
Alex Vestergaard; FOSS Analytical |
| 15:30 |
Why JTAG / Boundary Scan, with Technology and Market evolution |
Joao De Oliveira; XJTAG |
| 16:00 |
A low cost board tester built on IEEE std 1149.4 |
Anthony Sparks; JTAG Technologies |
| 16:30 16:40 |
Test Forum Close |
Knut Båtstoløkken |