Keynote Speakers

Keynote Speakers

Michael J Smith
Teradyne

Michael J Smith is currently a technologist for Teradyne’s Assemble Test Division based in North Reading Mass. He has over twenty years of experience with Automatic Test Equipment starting with simulator based functional test systems in the early 80’s, through to traditional electrical inspection systems, image based inspection systems and process monitoring and control. He has written numerous papers and articles as well as being the National Electronics Manufacturing Initiative (NEMI) Roadmapping Chair for Test and Inspection in 2000 and 2002 and IPC Technical Committee Member for APEX 2002,2003 and 2004. With a European background in technical support and sales he has been actively involved in product development based on his relationships with major customers worldwide.