Program
The program is also available as pdf. This page was updated 11.10.2006.
Register for the seminar. We may no longer guarantee the room availability, but registrations are still accepted.
| NTF05 -- 29 - 30 November 2005 | ||
| Day 1 - Tuesday 29 November | ||
| Time | Title | Presenter and other info |
| 07:30 | Transport from hotel via train station | |
| 08:30 | NTF Annual General Assembly | For members and other interested. |
| 09:15 | Transport from hotel via train station | For those who do not attend the Annual General Assembly. |
| 10:00 | Registration | |
| 10:30 |
Welcome/Introduction |
Knut Båtstoløkken |
| 10:40 |
Key Note Session |
Chairman: Knut Båtstoløkken |
| 10:40 |
Has boundary scan gone crazy, or has
boundary scan gone crazy?
|
Ben Bennetts, Bennetts Associates |
| 11:45 | Exhibition | |
| 12:15 | Lunch | |
| 13:15 |
Boundary Scan 1 |
Chairman: Jukka Antila |
| 13:15 |
A Transparent Solution for the Remote Wired
or Wireless Communication to Board and
System Level Boundary-Scan Architectures
|
Pete Collins, JTAG Technologies |
| 13:45 |
Analog component measurements with IEEE 1149.1 test system SW upgrade |
Pekka Kaukko, Elektrobit Testing OY |
| 14:15 |
Exhibitor presentations |
Chairman: Bjørn B. Larsen |
| 15:15 | Coffee Break | |
| 15:45 |
Functional Test |
Chairman: Stig Gunnar Jensen |
| 15:45 |
PCI Express - Expanding the world of virtual
Instrumentation |
Vidar Grønås and Leif Johansson, National Instruments |
| 16:15 |
Synthetic Instruments / LXI |
Jonny Langmyren, 4Test |
| 16:45 | Fruit & Refreshments / Exhibition | |
| 17:15 | News from conferences | Birger Schneider,
Jukka Antila, Pete Collins, Ben Bennetts, … |
| 17:45 |
Panel debate: "Influence of Outsourcing on Electronics Test in the Nordic Countries" |
Panel moderator: Birger Schneider |
| 19:00 | Transport to hotel | |
| 20:00 | Dinner | |
| 21:30 | Social get-together | |
| Day 2 - Wednesday 30 November 2005 | ||
| Time | Title | Presenter |
| 07:45 | Transport from hotel | |
| 08:30 |
Test Strategies, Test Economics |
Chairman: Mick Austin |
| 08:30 |
Global control of the outsourcing with Eltek Global
Test System
|
Mads Dahl, Eltek Energy AS |
| 09:15 |
WATS – Test data management |
Tom Andres Lomsdalen, Virinco |
| 09:30 | Coffee Break | |
| 10:00 |
Using Quality Estimate of a New Product to Analyze Efficiency of Testing
|
Jukka Antila, Nokia Networks and Markku Moilanen, University of Oulu |
| 10:30 |
Improving Productivity in Functional Test by Structured Re-Use of Test |
Birger Schneider, microLEX |
| 11:00 | Exhibition | |
| 11:30 | Lunch | |
| 12:30 |
Optical and X-Ray inspection |
Chairman: Jürgen Sedlacek |
| 12:30 |
3-D tomosynthetic reconstruction techniques for X-Ray inspection of circuit boards |
Michael J. Smith, Teradyne |
| 13:00 |
Advanced 3D X-Ray Computed Tomography of Electronic Devices |
André Egbert and Stefan Becker, phoenix|x-ray Systems + Services GmbH |
| 13:30 |
Update on Lead Free Inspection and Failure Mechanisms |
Michael J. Smith, Teradyne |
| 14:00 | Coffee Break | |
| 14:30 |
Boundary Scan 2 |
Chairman: Bengt Magnhagen |
| 14:30 |
Extended Boundary Scan |
Gerhard Vieweg, Goepel electronic |
| 15:00 |
Fault Insertion Using IEEE 1149.1: Silicon
Implementation and Tool Support |
Pete Collins, JTAG Technologies |
| 15:30 |
Boundary Scan training software |
Artur Jutman, Tallinn University of Technology |
| 16:00 | Test Forum Close | Knut Båtstoløkken |
| 16:30 | Transport to Kongsberg (hotel, train station) | |