Invited Speaker
Ben Bennetts
Bennetts Associates
Dr. R. G. “Ben” Bennets is an independent consultant in Design-For-Test (DFT), consulting in product life-cycle DFT strategies, and delivering on-site and open educational courses in DFT technologies. In a career spanning over thirty years, he has worked:
- In the Electronic Design Automation industry with LogicVision (96 - 97) and Synopsys (93 - 95) where he assisted with the specification of DFT synthesis products and development of the DFT market.
- As an independent DFT consultant (86 - 93) advising on technical and marketing activities in test technology, test strategies and DFT techniques for ASICs, boards and systems and lecturing extensively on these topics. During this time, he was a member of JTAG, the organisation that created the IEEE 1149.1 Boundary-Scan Standard.
- In the Automatic Test Equipment industry with GenRad (83 - 86) and Cirrus Computers (79 - 83), writing test programs and developing test methodologies and tools.
- As a researcher and lecturer at Southampton University, UK (68 - 78) where he obtained his Ph. D. in test-pattern generation, followed by extensive research into test-related topics.
Ben was Program Chair for the first three European Test Conferences and he has published over 100 papers plus three books on test and DFT subjects. He was the Invited Plenary-Session Speaker at the 1992 IEEE International Test Conference (ITC) and was Program Chair for the 1997 ITC. He was a member of ITC's Steering Committee between 1996 - 2000. He is currently an Advisor to the Board of Directors of ASSET InterTech, advising the company on future directions of boundary-scan technology, and a Founder Member of the Technical Advisory Board of Teseda, a producer of low-cost PC-based chip DFT testers.